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@ -6252,11 +6252,11 @@ const test_case_t test_case [] =
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TEST_CASE_STRUCT(TC_SIGNAL, TP_10MHZEXTRA, 30, 14, CAL_LEVEL, 26, -45), // 7 BPF loss and stop band
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TEST_CASE_STRUCT(TC_SIGNAL, TP_10MHZEXTRA, 30, 14, CAL_LEVEL, 26, -45), // 7 BPF loss and stop band
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TEST_CASE_STRUCT(TC_FLAT, TP_10MHZEXTRA, 30, 14, -28, 9, -60), // 8 BPF pass band flatness
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TEST_CASE_STRUCT(TC_FLAT, TP_10MHZEXTRA, 30, 14, -28, 9, -60), // 8 BPF pass band flatness
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TEST_CASE_STRUCT(TC_BELOW, TP_30MHZ, 880, 1, -95, 0, -100), // 9 LPF cutoff
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TEST_CASE_STRUCT(TC_BELOW, TP_30MHZ, 880, 1, -95, 0, -100), // 9 LPF cutoff
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TEST_CASE_STRUCT(TC_SIGNAL, TP_30MHZ_SWITCH,30, 7, CAL_LEVEL, 10, -50), // 10 Switch isolation using high attenuation
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TEST_CASE_STRUCT(TC_SIGNAL, TP_15MHZ_LNA, 30, 5, CAL_LEVEL, 10, -90), // 10 LPF flatness
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TEST_CASE_STRUCT(TC_DISPLAY, TP_30MHZ, 30, 0, CAL_LEVEL, 50, -60), // 11 test display
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TEST_CASE_STRUCT(TC_SIGNAL, TP_30MHZ_SWITCH,30, 7, CAL_LEVEL, 10, -50), // 11 Switch isolation using high attenuation
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TEST_CASE_STRUCT(TC_ATTEN, TP_30MHZ, 30, 0, CAL_LEVEL, 50, -60), // 12 Measure atten step accuracy
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TEST_CASE_STRUCT(TC_DISPLAY, TP_30MHZ, 30, 0, CAL_LEVEL, 50, -60), // 12 test display
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TEST_CASE_STRUCT(TC_SIGNAL, TP_30MHZ_LNA, 30, 5, CAL_LEVEL, 10, -75), // 13 Measure LNA
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TEST_CASE_STRUCT(TC_ATTEN, TP_30MHZ, 30, 0, CAL_LEVEL, 50, -60), // 13 Measure atten step accuracy
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TEST_CASE_STRUCT(TC_SIGNAL, TP_15MHZ_LNA, 30, 5, CAL_LEVEL, 10, -90), // 14 LPF flatness
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TEST_CASE_STRUCT(TC_SIGNAL, TP_30MHZ_LNA, 30, 5, CAL_LEVEL, 10, -75), // 14 Measure LNA
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#define TEST_END 14
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#define TEST_END 14
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TEST_CASE_STRUCT(TC_END, 0, 0, 0, 0, 0, 0),
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TEST_CASE_STRUCT(TC_END, 0, 0, 0, 0, 0, 0),
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#define TEST_POWER 15
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#define TEST_POWER 15
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