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Use more compact test_case_t structure

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Removed_REF_marker
DiSlord 5 years ago
parent c6fc9a5d80
commit 00e799e09f
1 changed files with 54 additions and 50 deletions
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104
sa_core.c
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@ -3701,80 +3701,84 @@ enum {
#define CAL_LEVEL -25 #define CAL_LEVEL -25
#endif #endif
// TODO made more compact this structure (need use aligned data)
typedef struct test_case { typedef struct test_case {
int kind; uint8_t kind;
int setup; uint8_t setup;
int16_t width;
float center; // In MHz float center; // In MHz
float span; // In MHz float span; // In MHz
float pass; float pass;
int width;
float stop; float stop;
} test_case_t; } test_case_t;
// Use this data parser for init structure data
#define TEST_CASE_STRUCT(Condition, Preparation, Center, Span, Pass, Width, Stop) {Condition, Preparation, Width, Center, Span, Pass, Stop}
const test_case_t test_case [] = const test_case_t test_case [] =
#ifdef TINYSA4 #ifdef TINYSA4
{// Condition Preparation Center Span Pass Width(%)Stop {// Condition Preparation Center Span Pass Width(%)Stop
{TC_BELOW, TP_SILENT, 0.005, 0.01, 0, 0, 0}, // 1 Zero Hz leakage TEST_CASE_STRUCT(TC_BELOW, TP_SILENT, 0.005, 0.01, 0, 0, 0), // 1 Zero Hz leakage
{TC_BELOW, TP_SILENT, 0.015, 0.01, -30, 0, 0}, // 2 Phase noise of zero Hz TEST_CASE_STRUCT(TC_BELOW, TP_SILENT, 0.015, 0.01, -30, 0, 0), // 2 Phase noise of zero Hz
{TC_SIGNAL, TP_30MHZ, 30, 7, -30, 10, -90 }, // 3 TEST_CASE_STRUCT(TC_SIGNAL, TP_30MHZ, 30, 7, -30, 10, -90), // 3
{TC_SIGNAL, TP_30MHZ, 60, 7, -70, 10, -90 }, // 4 TEST_CASE_STRUCT(TC_SIGNAL, TP_30MHZ, 60, 7, -70, 10, -90), // 4
#define TEST_SILENCE 4 #define TEST_SILENCE 4
{TC_BELOW, TP_SILENT, 200, 100, -75, 0, 0}, // 5 Wide band noise floor low mode TEST_CASE_STRUCT(TC_BELOW, TP_SILENT, 200, 100, -75, 0, 0), // 5 Wide band noise floor low mode
{TC_BELOW, TPH_SILENT, 600, 720, -75, 0, 0}, // 6 Wide band noise floor high mode TEST_CASE_STRUCT(TC_BELOW, TPH_SILENT, 600, 720, -75, 0, 0), // 6 Wide band noise floor high mode
{TC_SIGNAL, TP_10MHZEXTRA, 30, 14, -20, 27, -80 }, // 7 BPF loss and stop band TEST_CASE_STRUCT(TC_SIGNAL, TP_10MHZEXTRA, 30, 14, -20, 27, -80), // 7 BPF loss and stop band
{TC_FLAT, TP_10MHZEXTRA, 30, 14, -18, 9, -60}, // 8 BPF pass band flatness TEST_CASE_STRUCT(TC_FLAT, TP_10MHZEXTRA, 30, 14, -18, 9, -60), // 8 BPF pass band flatness
{TC_BELOW, TP_30MHZ, 400, 60, -75, 0, -75}, // 9 LPF cutoff TEST_CASE_STRUCT(TC_BELOW, TP_30MHZ, 400, 60, -75, 0, -75), // 9 LPF cutoff
{TC_SIGNAL, TP_10MHZ_SWITCH,20, 7, -39, 10, -60 }, // 10 Switch isolation using high attenuation TEST_CASE_STRUCT(TC_SIGNAL, TP_10MHZ_SWITCH,20, 7, -39, 10, -60), // 10 Switch isolation using high attenuation
{TC_DISPLAY, TP_30MHZ, 30, 0, -25, 145, -60 }, // 11 Measure atten step accuracy TEST_CASE_STRUCT(TC_DISPLAY, TP_30MHZ, 30, 0, -25, 145, -60), // 11 Measure atten step accuracy
{TC_ATTEN, TP_30MHZ, 30, 0, CAL_LEVEL, 145, -60 }, // 12 Measure atten step accuracy TEST_CASE_STRUCT(TC_ATTEN, TP_30MHZ, 30, 0, CAL_LEVEL, 145, -60), // 12 Measure atten step accuracy
#define TEST_END 12 #define TEST_END 12
{TC_END, 0, 0, 0, 0, 0, 0}, TEST_CASE_STRUCT(TC_END, 0, 0, 0, 0, 0, 0),
#define TEST_POWER 13 #define TEST_POWER 13
{TC_MEASURE, TP_30MHZ, 30, 7, CAL_LEVEL, 10, -55 }, // 12 Measure power level and noise TEST_CASE_STRUCT(TC_MEASURE, TP_30MHZ, 30, 7, CAL_LEVEL, 10, -55), // 12 Measure power level and noise
{TC_MEASURE, TP_30MHZ, 270, 4, -50, 10, -75 }, // 13 Measure powerlevel and noise TEST_CASE_STRUCT(TC_MEASURE, TP_30MHZ, 270, 4, -50, 10, -75), // 13 Measure powerlevel and noise
{TC_MEASURE, TPH_30MHZ, 270, 4, -40, 10, -65 }, // 14 Calibrate power high mode TEST_CASE_STRUCT(TC_MEASURE, TPH_30MHZ, 270, 4, -40, 10, -65), // 14 Calibrate power high mode
{TC_END, 0, 0, 0, 0, 0, 0}, TEST_CASE_STRUCT(TC_END, 0, 0, 0, 0, 0, 0),
#define TEST_RBW 17 #define TEST_RBW 17
{TC_MEASURE, TP_30MHZ, 30, 1, CAL_LEVEL, 10, -60 }, // 16 Measure RBW step time TEST_CASE_STRUCT(TC_MEASURE, TP_30MHZ, 30, 1, CAL_LEVEL, 10, -60), // 16 Measure RBW step time
{TC_END, 0, 0, 0, 0, 0, 0}, TEST_CASE_STRUCT(TC_END, 0, 0, 0, 0, 0, 0),
{TC_MEASURE, TPH_30MHZ, 300, 4, -48, 10, -65 }, // 14 Calibrate power high mode TEST_CASE_STRUCT(TC_MEASURE, TPH_30MHZ, 300, 4, -48, 10, -65), // 14 Calibrate power high mode
{TC_MEASURE, TPH_30MHZ_SWITCH,300, 4, -40, 10, -65 }, // 14 Calibrate power high mode TEST_CASE_STRUCT(TC_MEASURE, TPH_30MHZ_SWITCH,300, 4, -40, 10, -65), // 14 Calibrate power high mode
#define TEST_ATTEN 21 #define TEST_ATTEN 21
{TC_ATTEN, TP_30MHZ, 30, 0, -25, 145, -60 }, // 20 Measure atten step accuracy TEST_CASE_STRUCT(TC_ATTEN, TP_30MHZ, 30, 0, -25, 145, -60), // 20 Measure atten step accuracy
#define TEST_SPUR 22 #define TEST_SPUR 22
{TC_BELOW, TP_SILENT, 144, 8, -95, 0, 0 }, // 22 Measure 48MHz spur TEST_CASE_STRUCT(TC_BELOW, TP_SILENT, 144, 8, -95, 0, 0), // 22 Measure 48MHz spur
}; };
#else #else
{// Condition Preparation Center Span Pass Width(%)Stop {// Condition Preparation Center Span Pass Width(%)Stop
{TC_BELOW, TP_SILENT, 0.005, 0.01, 0, 0, 0}, // 1 Zero Hz leakage TEST_CASE_STRUCT(TC_BELOW, TP_SILENT, 0.005, 0.01, 0, 0, 0), // 1 Zero Hz leakage
{TC_BELOW, TP_SILENT, 0.015, 0.01, -30, 0, 0}, // 2 Phase noise of zero Hz TEST_CASE_STRUCT(TC_BELOW, TP_SILENT, 0.015, 0.01, -30, 0, 0), // 2 Phase noise of zero Hz
{TC_SIGNAL, TP_10MHZ, 20, 7, -39, 10, -90 }, // 3 TEST_CASE_STRUCT(TC_SIGNAL, TP_10MHZ, 20, 7, -39, 10, -90), // 3
{TC_SIGNAL, TP_10MHZ, 30, 7, -34, 10, -90 }, // 4 TEST_CASE_STRUCT(TC_SIGNAL, TP_10MHZ, 30, 7, -34, 10, -90), // 4
#define TEST_SILENCE 4 #define TEST_SILENCE 4
{TC_BELOW, TP_SILENT, 200, 100, -75, 0, 0}, // 5 Wide band noise floor low mode TEST_CASE_STRUCT(TC_BELOW, TP_SILENT, 200, 100, -75, 0, 0), // 5 Wide band noise floor low mode
{TC_BELOW, TPH_SILENT, 600, 720, -75, 0, 0}, // 6 Wide band noise floor high mode TEST_CASE_STRUCT(TC_BELOW, TPH_SILENT, 600, 720, -75, 0, 0), // 6 Wide band noise floor high mode
{TC_SIGNAL, TP_10MHZEXTRA, 10, 7, -20, 27, -80 }, // 7 BPF loss and stop band TEST_CASE_STRUCT(TC_SIGNAL, TP_10MHZEXTRA, 10, 7, -20, 27, -80), // 7 BPF loss and stop band
{TC_FLAT, TP_10MHZEXTRA, 10, 4, -18, 9, -60}, // 8 BPF pass band flatness TEST_CASE_STRUCT(TC_FLAT, TP_10MHZEXTRA, 10, 4, -18, 9, -60), // 8 BPF pass band flatness
{TC_BELOW, TP_30MHZ, 400, 60, -75, 0, -75}, // 9 LPF cutoff TEST_CASE_STRUCT(TC_BELOW, TP_30MHZ, 400, 60, -75, 0, -75), // 9 LPF cutoff
{TC_SIGNAL, TP_10MHZ_SWITCH,20, 7, -39, 10, -60 }, // 10 Switch isolation using high attenuation TEST_CASE_STRUCT(TC_SIGNAL, TP_10MHZ_SWITCH,20, 7, -39, 10, -60), // 10 Switch isolation using high attenuation
{TC_DISPLAY, TP_30MHZ, 30, 0, -25, 145, -60 }, // 11 Measure atten step accuracy TEST_CASE_STRUCT(TC_DISPLAY, TP_30MHZ, 30, 0, -25, 145, -60), // 11 Measure atten step accuracy
{TC_ATTEN, TP_30MHZ, 30, 0, -25, 145, -60 }, // 12 Measure atten step accuracy TEST_CASE_STRUCT(TC_ATTEN, TP_30MHZ, 30, 0, -25, 145, -60), // 12 Measure atten step accuracy
#define TEST_END 12 #define TEST_END 12
{TC_END, 0, 0, 0, 0, 0, 0}, TEST_CASE_STRUCT(TC_END, 0, 0, 0, 0, 0, 0),
#define TEST_POWER 13 #define TEST_POWER 13
{TC_MEASURE, TP_30MHZ, 30, 7, -25, 10, -55 }, // 12 Measure power level and noise TEST_CASE_STRUCT(TC_MEASURE, TP_30MHZ, 30, 7, -25, 10, -55), // 12 Measure power level and noise
{TC_MEASURE, TP_30MHZ, 270, 4, -50, 10, -75 }, // 13 Measure powerlevel and noise TEST_CASE_STRUCT(TC_MEASURE, TP_30MHZ, 270, 4, -50, 10, -75), // 13 Measure powerlevel and noise
{TC_MEASURE, TPH_30MHZ, 270, 4, -40, 10, -65 }, // 14 Calibrate power high mode TEST_CASE_STRUCT(TC_MEASURE, TPH_30MHZ, 270, 4, -40, 10, -65), // 14 Calibrate power high mode
{TC_END, 0, 0, 0, 0, 0, 0}, TEST_CASE_STRUCT(TC_END, 0, 0, 0, 0, 0, 0),
#define TEST_RBW 17 #define TEST_RBW 17
{TC_MEASURE, TP_30MHZ, 30, 1, -20, 10, -60 }, // 16 Measure RBW step time TEST_CASE_STRUCT(TC_MEASURE, TP_30MHZ, 30, 1, -20, 10, -60), // 16 Measure RBW step time
{TC_END, 0, 0, 0, 0, 0, 0}, TEST_CASE_STRUCT(TC_END, 0, 0, 0, 0, 0, 0),
{TC_MEASURE, TPH_30MHZ, 300, 4, -48, 10, -65 }, // 14 Calibrate power high mode TEST_CASE_STRUCT(TC_MEASURE, TPH_30MHZ, 300, 4, -48, 10, -65), // 14 Calibrate power high mode
{TC_MEASURE, TPH_30MHZ_SWITCH,300, 4, -40, 10, -65 }, // 14 Calibrate power high mode TEST_CASE_STRUCT(TC_MEASURE, TPH_30MHZ_SWITCH,300, 4, -40, 10, -65), // 14 Calibrate power high mode
#define TEST_ATTEN 21 #define TEST_ATTEN 21
{TC_ATTEN, TP_30MHZ, 30, 0, -25, 145, -60 }, // 20 Measure atten step accuracy TEST_CASE_STRUCT(TC_ATTEN, TP_30MHZ, 30, 0, -25, 145, -60), // 20 Measure atten step accuracy
#define TEST_SPUR 22 #define TEST_SPUR 22
{TC_BELOW, TP_SILENT, 96, 8, -95, 0, 0 }, // 22 Measure 48MHz spur TEST_CASE_STRUCT(TC_BELOW, TP_SILENT, 96, 8, -95, 0, 0), // 22 Measure 48MHz spur
}; };
#endif #endif

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