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/*
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* Copyright (c) 2022 by Geoffrey Merck F4FXL / KC3FRA
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*
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* This program is free software; you can redistribute it and/or modify
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* it under the terms of the GNU General Public License as published by
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* the Free Software Foundation; either version 2 of the License, or
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* (at your option) any later version.
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*
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* This program is distributed in the hope that it will be useful,
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* but WITHOUT ANY WARRANTY; without even the implied warranty of
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* MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
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* GNU General Public License for more details.
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*
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* You should have received a copy of the GNU General Public License
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* along with this program; if not, write to the Free Software
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* Foundation, Inc., 675 Mass Ave, Cambridge, MA 02139, USA.
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*/
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#include <gtest/gtest.h>
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#include "Utils.h"
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#include "StringUtils.h"
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#include "Log.h"
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class Utils_swap_endian_le : public ::testing::Test {
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};
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// This test will fail on big endian systems....
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TEST_F(Utils_swap_endian_le, SwapUINT32_be) {
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uint32_t test = 0x12345678U;
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uint32_t res = CUtils::swap_endian_le(test);
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EXPECT_EQ(res, 0x78563412U);
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}
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